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15 December 2000
Vol 290, Issue 5499, Pages 2021-2200

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A

Abstract » Full Text » Adam, L. ( in Research Articles )
Letters » Agarwal, Vijendra K. ( in Letters )
Full Text » Ahern, Kevin ( in Tech.Sight )
Abstract » Full Text » Akashi, Koichi ( in Reports )
Abstract » Full Text » Allen, M. R. ( in Reports )
Abstract » Full Text » Averett, T. ( in Reports )
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B

Abstract » Full Text » Barkhuff, D. ( in Reports )
Abstract » Full Text » Beck, D. H. ( in Reports )
Abstract » Full Text » Beise, E. J. ( in Reports )
Full Text » Berger, Edward A. ( in Technical Comments )
Letters » Bibby, Colin ( in Letters )
Letters » Bisby, Frank A. ( in Letters )
Abstract » Full Text » Black, C. T. ( in Reports )
Abstract » Full Text » Blake, A. ( in Reports )
Letters » Boitani, Luigi ( in Letters )
Abstract » Full Text » Boulanger, Lisa M. ( in Reports )
Letters » Brackett, David ( in Letters )
Summary » Full Text » Breaker, Ronald R. ( in Tech.Sight )
Abstract » Full Text » Breuer, H. ( in Reports )
Abstract » Full Text » Brotz, Tilmann M. ( in Reports )
Abstract » Full Text » Broun, P. ( in Research Articles )
Abstract » Full Text » Brown, Daniel G. ( in Research Articles )
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C

Abstract » Full Text » Carr, R. ( in Reports )
Abstract » Full Text » Chang, Hur-Song ( in Research Articles )
Summary » Chin, Gilbert J. ( in Editors' Choice: Highlights of the recent literature )
Full Text » Colla, Joseph S. ( in Technical Comments )
Full Text » Combadière, Christophe ( in Technical Comments )
Letters » Corsi, Fabio ( in Letters )
Abstract » Full Text » Covrig, S. ( in Reports )
Abstract » Full Text » Creelman, R. ( in Research Articles )
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D

Letters » da Fonseca, Gustavo A. B. ( in Letters )
Abstract » Full Text » Danagoulian, A. ( in Reports )
Summary » Full Text » Dangl, Jeff ( in Policy Forum )
Summary » Dean, Caroline ( in Editorial )
Abstract » Full Text » DeRosier, David J. ( in Reports )
Letters » Dixon, Mariano Gimenez ( in Letters )
Abstract » Full Text » Dodson, G. ( in Reports )
Abstract » Full Text » Dow, K. ( in Reports )
Abstract » Full Text » Du, Hongping ( in Reports )
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E

Letters » Edwards, James L. ( in Letters )
Abstract » Full Text » Efimenko, Kirill ( in Reports )
Abstract » Full Text » Emley, N. ( in Reports )
Abstract » Full Text » Engleman, Edgar G. ( in Reports )
Summary » Full Text » Enserink, Martin ( in News of the Week )
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F

Abstract » Full Text » Farkhondeh, M. ( in Reports )
Abstract » Full Text » Feldblyum, Tamara ( in Reports )
Summary » Full Text » Ferber, Dan ( in News Focus )
Abstract » Full Text » Filippone, B. W. ( in Reports )
Summary » Full Text » Frank, Lone ( in News of the Week )
Abstract » Full Text » Fraser, Claire M. ( in Reports )
Abstract » Full Text » Friend, R. H. ( in Reports )
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G

Abstract » Full Text » Gao, J. ( in Reports )
Letters » Gascon, Claude ( in Letters )
Abstract » Full Text » Genzer, Jan ( in Reports )
Abstract » Full Text » Ghandehari, D. ( in Research Articles )
Full Text » Goedert, James J. ( in Technical Comments )
Abstract » Full Text » Griffiths, William ( in Reports )
Abstract » Full Text » Guarini, K. ( in Reports )
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H

Abstract » Full Text » Han, Bin ( in Research Articles )
Summary » Hanson, Brooks ( in Editors' Choice: Highlights of the recent literature )
Abstract » Full Text » Harmer, Stacey L. ( in Research Articles )
Abstract » Full Text » Hasty, R. ( in Reports )
Abstract » Full Text » Hawthorne-Allen, A. M. ( in Reports )
Abstract » Full Text » Heard, J. ( in Research Articles )
Abstract » Full Text » Helfand, Stephen L. ( in Reports )
Summary » Full Text » Helmuth, Laura ( in News of the Week )
Abstract » Full Text » Herda, M. C. ( in Reports )
Letters » Hilton-Taylor, Craig ( in Letters )
Abstract » Full Text » Hogenesch, John B. ( in Research Articles )
Summary » Full Text » Hogg, David W. ( in Books )
Abstract » Full Text » Huh, Gene S. ( in Reports )
Summary » Hurtley, Stella M. ( in Editors' Choice: Highlights of the recent literature )
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I

Abstract » Full Text » Imada, Katsumi ( in Reports )
Abstract » Full Text » Inbasekaran, M. ( in Reports )
Abstract » Full Text » Ito, T. M. ( in Reports )
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J

Abstract » Full Text » Jenkins, G. J. ( in Reports )
Abstract » Full Text » Jiang, ( in Research Articles )
Abstract » Full Text » Jones, C. E. ( in Reports )
Abstract » Full Text » Jones, G. S. ( in Reports )
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K

Summary » Full Text » Kaiser, Jocelyn ( in News of the Week )
Full Text » Kaslow, Richard A. ( in Technical Comments )
Abstract » Full Text » Kästle, G. A. ( in Reports )
Abstract » Full Text » Kawase, T. ( in Reports )
Abstract » Full Text » Kay, Steve A. ( in Research Articles )
Abstract » Full Text » Keddie, J. ( in Research Articles )
Full Text » Kleeberger, Cynthia A. ( in Technical Comments )
Abstract » Full Text » Korsch, W. ( in Reports )
Abstract » Full Text » Kowalski, S. ( in Reports )
Abstract » Full Text » Kramer, K. ( in Reports )
Abstract » Full Text » Kreps, Joel A. ( in Research Articles )
Abstract » Full Text » Krusin-Elbaum, L. ( in Reports )
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L

Letters » Lane, Meredith A. ( in Letters )
Abstract » Full Text » Laub, Michael T. ( in Reports )
Abstract » Full Text » Lee, P. ( in Reports )
Full Text » Leitman, Susan F. ( in Technical Comments )
Abstract » Full Text » Liu, Suya ( in Reports )
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M

Letters » Mace, Georgine ( in Letters )
Summary » Full Text » Macnab, Robert M. ( in Perspectives )
Abstract » Full Text » Maki, Saori ( in Reports )
Abstract » Full Text » Manz, Markus ( in Reports )
Summary » Full Text » Marshall, Eliot ( in News of the Week )
Abstract » Full Text » Martin, G. ( in Research Articles )
Summary » Full Text » May, Robert M. ( in Perspectives )
Abstract » Full Text » McAdams, Harley H. ( in Reports )
Full Text » McDermott, David H. ( in Technical Comments )
Abstract » Full Text » McKeown, R. D. ( in Reports )
Abstract » Full Text » Merad, Miriam ( in Reports )
Abstract » Full Text » Mitchell, J. F. B. ( in Reports )
Full Text » Mitchell, Kathy E. ( in Tech.Sight )
Letters » Mittermeier, Russell A. ( in Letters )
Abstract » Full Text » Miyamoto, Toshihiro ( in Reports )
Summary » Full Text » Mlot, Christine ( in News Focus )
Abstract » Full Text » Morgan, David Gene ( in Reports )
Abstract » Full Text » Mueller, B. ( in Reports )
Summary » Full Text » Muro, Mark ( in News of the Week )
Full Text » Murphy, Philip M. ( in Technical Comments )
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N

Abstract » Full Text » Namba, Keiichi ( in Reports )
Abstract » Full Text » Ng, Kwok H. ( in Reports )
Letters » Nielsen;, Ebbe S. ( in Letters )
Abstract » Full Text » Nilsen, Steven P. ( in Reports )
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O

Full Text » O'Brien, Thomas R. ( in Technical Comments )
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P

Abstract » Full Text » Penner, Reginald M. ( in Reports )
Summary » Full Text » Pennisi, Elizabeth ( in News Focus )
Summary » Full Text » Pennisi, Elizabeth ( in News Focus )
Summary » Full Text » Pennisi, Elizabeth ( in News Focus )
Summary » Full Text » Pennisi, Elizabeth ( in News of the Week )
Abstract » Full Text » Perlmann, Thomas ( in Reports )
Abstract » Full Text » Phifer, and P. R. ( in Review )
Abstract » Full Text » Pilgrim, M. ( in Research Articles )
Abstract » Full Text » Pineda, O. ( in Research Articles )
Abstract » Full Text » Pitt, M. ( in Reports )
Full Text » Plankey, Michael ( in Technical Comments )
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R

Letters » Rabinovich, Jorge ( in Letters )
Abstract » Full Text » Ratcliffe, O. J. ( in Research Articles )
Abstract » Full Text » Reenan, Robert A. ( in Reports )
Abstract » Full Text » Reuber, L. ( in Research Articles )
Letters » Richardson, Barry J. ( in Letters )
Abstract » Full Text » Riechmann, J. L. ( in Research Articles )
Abstract » Full Text » Riquelme, Patricio A. ( in Reports )
Abstract » Full Text » Ritter, J. ( in Reports )
Abstract » Full Text » Roche, J. ( in Reports )
Abstract » Full Text » Rogina, Blanka ( in Reports )
Full Text » Rosenberg, Philip S. ( in Technical Comments )
Summary » Full Text » Rosner, Günther ( in Perspectives )
Abstract » Full Text » Russell, T. P. ( in Reports )
Letters » Rylands, Anthony ( in Letters )
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S

Abstract » Full Text » Samaha, R. R. ( in Research Articles )
Abstract » Full Text » Savu, V. ( in Reports )
Summary » Full Text » Schilling, Govert ( in News of the Week )
Abstract » Full Text » Schotter, J. ( in Reports )
Summary » Full Text » Seife, Charles ( in News of the Week )
Summary » Full Text » Service, Robert F. ( in News of the Week )
Letters » Sette, Alessandro ( in Letters )
Abstract » Full Text » Shapiro, Lucy ( in Reports )
Abstract » Full Text » Shatz, Carla J. ( in Reports )
Abstract » Full Text » Sherman, B. K. ( in Research Articles )
Abstract » Full Text » Shibauchi, T. ( in Reports )
Abstract » Full Text » Shimoda, T. ( in Reports )
Full Text » Shmaefsky, Brian R. ( in Tech.Sight )
Abstract » Full Text » Sirringhaus, H. ( in Reports )
Abstract » Full Text » Sjöberg, Maria ( in Reports )
Abstract » Full Text » Sjövall, Jan ( in Reports )
Letters » Smith, Andrew T. ( in Letters )
Full Text » Smith, Erica D. ( in Technical Comments )
Summary » Smith, H. Jesse ( in Editors' Choice: Highlights of the recent literature )
Full Text » Smith, Orla ( in Perspectives )
Summary » Full Text » Somerville, Chris ( in Policy Forum )
Abstract » Full Text » Spayde, D. T. ( in Reports )
Letters » Stein, Bruce ( in Letters )
Summary » Full Text » Stone, Richard ( in News Focus )
Summary » Full Text » Stone, Richard ( in News of the Week )
Abstract » Full Text » Stott, Peter A. ( in Reports )
Abstract » Full Text » Straume, Marty ( in Research Articles )
Summary » Full Text » Strauss, Evelyn ( in News of the Week )
Letters » Stuart, Simon ( in Letters )
Summary » Full Text » Stumpf, Michael P. H. ( in Perspectives )
Letters » Su, Deming ( in Letters )
Summary » Sugden, Andrew M. ( in Editors' Choice: Highlights of the recent literature )
Summary » Szuromi, Phil D. ( in Editors' Choice: Highlights of the recent literature )
Summary » Szuromi, Phil D. ( in Editors' Choice: Highlights of the recent literature )
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T

Abstract » Full Text » Tanksley, Steven D. ( in Research Articles )
Abstract » Full Text » Tett, S. F. B. ( in Reports )
Letters » Thomsen, Jorgen ( in Letters )
Abstract » Full Text » Thurn-Albrecht, T. ( in Reports )
Abstract » Full Text » Tieulent, R. ( in Reports )
Abstract » Full Text » Traver, David ( in Reports )
Abstract » Full Text » Tsentalovich, E. ( in Reports )
Abstract » Full Text » Tuominen, M. T. ( in Reports )
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U

Abstract » Full Text » Urquiza, Alexander Mata de ( in Reports )
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V

Summary » Vinson, Valda ( in Editors' Choice: Highlights of the recent literature )
Abstract » Full Text » Vision, Todd J. ( in Research Articles )
Summary » Full Text » Vogel, Gretchen ( in News of the Week )
Abstract » Full Text » Vonderviszt, Ferenc ( in Reports )
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W

Abstract » Full Text » Wang, Xun ( in Research Articles )
Full Text » Wass, John A. ( in Tech.Sight )
Summary » Full Text » Weaver, Andrew J. ( in Perspectives )
Abstract » Full Text » Weissman, Irving L. ( in Reports )
Abstract » Full Text » Wells, S. P. ( in Reports )
Letters » Wilson;, Crispen ( in Letters )
Abstract » Full Text » Wolfenbarger, L. L. ( in Review )
Abstract » Full Text » Woo, E. P. ( in Reports )
Abstract » Full Text » Wu, W. ( in Reports )
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Y

Abstract » Full Text » Yang, B. ( in Reports )
Summary » Full Text » Yimin, Ding ( in News Focus )
Abstract » Full Text » Yonekura, Koji ( in Reports )
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Z

Abstract » Full Text » Zach, Michael P. ( in Reports )
Summary » Full Text » Zaldarriaga, Matias ( in Books )
Abstract » Full Text » Zetterström, Rolf H. ( in Reports )
Abstract » Full Text » Zhang, J. Z. ( in Research Articles )
Letters » Zhang, Liang ( in Letters )
Letters » Zhong, Yang ( in Letters )
Abstract » Full Text » Zhu, Tong ( in Research Articles )
Full Text » Zimmerman, Peter A. ( in Technical Comments )
Abstract » Full Text » Zwart, T. ( in Reports )
Summary » Full Text » Zwiers, Francis W. ( in Perspectives )
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-

Abstract » Full Text » -L. Yu, G. ( in Research Articles )
Abstract » Full Text » -Z., C. ( in Research Articles )
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