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15 September 2000
Vol 289, Issue 5486, Pages 1829-1992

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A

Abstract » Full Text » Adelman, John P. ( in Reports )
Abstract » Full Text » Aravind, L. ( in Research Articles )
Summary » Ash, Caroline ( in Editors' Choice: Highlights of the recent literature )
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B

Abstract » Full Text » Baetscher, Manfred ( in Reports )
Summary » Full Text » Balter, Michael ( in News Focus )
Summary » Full Text » Balter, Michael ( in News of the Week )
Abstract » Full Text » Bass, Brenda L. ( in Reports )
Abstract » Full Text » Béjà, Oded ( in Research Articles )
Full Text » Bertrand, Carol A. ( in Tech.Sight )
Letters » Birnbaum, Linda S. ( in Letters )
Abstract » Full Text » Bissonnette, John M. ( in Reports )
Summary » Full Text » Blackwell, Meredith ( in Perspectives )
Abstract » Full Text » Bonadeo, N. H. ( in Reports )
Abstract » Full Text » Bond, Chris T. ( in Reports )
Abstract » Full Text » Bornmann, William ( in Reports )
Summary » Full Text » Bourne, Joel ( in News Focus )
Abstract » Full Text » Bratzke, Hansjürgen ( in Reports )
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C

Abstract » Full Text » Chebassier, C. ( in Reports )
Abstract » Full Text » Chen, Gang ( in Reports )
Abstract » Full Text » Chesley, John T. ( in Reports )
Summary » Chin, Gilbert J. ( in Editors' Choice: Highlights of the recent literature )
Summary » Clark, Colin W. ( in Editorial )
Abstract » Full Text » Clarkson, Bayard ( in Reports )
Summary » Full Text » Cohen, Jon ( in News of the Week )
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D

Abstract » Full Text » Davis, M. E. ( in Reports )
Abstract » Full Text » DeLong, Edward F. ( in Research Articles )
Abstract » Full Text » Domeier, Mary Ellen ( in Reports )
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E

Summary » E. Sinclair, A. R. ( in Editorial )
Abstract » Full Text » Entelis, N. S. ( in Reports )
Abstract » Full Text » Ermonval, M. ( in Reports )
Summary » Full Text » Evans, Nancy Remage ( in Perspectives )
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F

Abstract » Full Text » Feldman, Robert A. ( in Research Articles )
Summary » Full Text » Fisher, Kathleen ( in News of the Week )
Abstract » Full Text » Fox, T. D. ( in Reports )
Abstract » Full Text » Frant, M. S. ( in Reports )
Letters » Frewer, A. ( in Letters )
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G

Abstract » Full Text » Galuske, Ralf A. W. ( in Reports )
Abstract » Full Text » Gammon, D. ( in Reports )
Abstract » Full Text » Garavito, R. M. ( in Reports )
Full Text » Garcia, Hernan E. ( in Technical Comments )
Abstract » Full Text » Gates, Christian M. ( in Research Articles )
Summary » Full Text » Gazzaniga, Michael S. ( in Perspectives )
Abstract » Full Text » Ginell, S. L. ( in Reports )
Full Text » Gordon, Louis I. ( in Technical Comments )
Summary » Gough, Nancy ( in Editors' Choice: Highlights of the recent literature )
Abstract » Full Text » Graham, Linda E. ( in Reports )
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H

Abstract » Full Text » Hadd, Andrew ( in Research Articles )
Letters » Hanefeld, F. ( in Letters )
Summary » Hanson, Brooks ( in Editors' Choice: Highlights of the recent literature )
Abstract » Full Text » Harwood, Richard R. ( in Reports )
Abstract » Full Text » Hecht, M. H. ( in Reports )
Abstract » Full Text » Henderson, K. A. ( in Reports )
Letters » Hillis, David M. ( in Letters )
Summary » Hines, Pamela J. ( in Editors' Choice: Highlights of the recent literature )
Summary » Full Text » Hood, Leroy ( in Policy Forum )
Full Text » Hoover, Frank ( in Tech.Sight )
Summary » Hurtley, Stella M. ( in Editors' Choice: Highlights of the recent literature )
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J

Abstract » Full Text » Jacobsen, Stein B. ( in Reports )
Abstract » Full Text » Jerecic, Jasna ( in Reports )
Abstract » Full Text » Jovanovich, Stevan B. ( in Research Articles )
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K

Abstract » Full Text » Katzer, D. S. ( in Reports )
Abstract » Full Text » Kaufmann, Walter A. ( in Reports )
Abstract » Full Text » Kellermann, O. ( in Reports )
Summary » Full Text » Kerr, Richard A. ( in News Focus )
Abstract » Full Text » Kim, S. S. ( in Reports )
Summary » Full Text » Kinzler, Kenneth W. ( in Tech.Sight )
Abstract » Full Text » Knaus, Hans-Günther ( in Reports )
Abstract » Full Text » Knight, Scott W. ( in Reports )
Abstract » Full Text » Kodner, Robin ( in Reports )
Summary » Full Text » Koenig, Robert ( in News Focus )
Summary » Full Text » Koenig, Robert ( in News of the Week )
Abstract » Full Text » Kolesnikova, O. A. ( in Reports )
Abstract » Full Text » Koonin, Eugene V. ( in Research Articles )
Letters » Korn, David ( in Letters )
Abstract » Full Text » Kuriyan, John ( in Reports )
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L

Summary » Full Text » LaBarbera, Michael ( in Books )
Summary » Full Text » Lane, Robert P. ( in Policy Forum )
Abstract » Full Text » Laplanche, J. L. ( in Reports )
Abstract » Full Text » Launay, J. M. ( in Reports )
Summary » Full Text » Lawler, Andrew ( in News of the Week )
Abstract » Full Text » Lee, Cin-Ty ( in Reports )
Abstract » Full Text » Lehmann, S. ( in Reports )
Abstract » Full Text » Lin, P.-N. ( in Reports )
Summary » Full Text » Lovett, Richard A. ( in News of the Week )
Summary » Ludwig, Donald ( in Editorial )
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M

Letters » M. E. Osterhaus, Albert D. ( in Letters )
Abstract » Full Text » Malkowski, M. G. ( in Reports )
Abstract » Full Text » Mango, Susan E. ( in Reports )
Letters » Marcus, Michele ( in Letters )
Abstract » Full Text » Martin, R. P. ( in Reports )
Summary » Full Text » Marx, Jean ( in News of the Week )
Abstract » Full Text » Maylie, James ( in Reports )
Full Text » McCallum, Bruce ( in Tech.Sight )
Summary » Full Text » Mervis, Jeffrey ( in News of the Week )
Abstract » Full Text » Miller, W. Todd ( in Reports )
Abstract » Full Text » Mireau, H. ( in Reports )
Full Text » Mordy, Calvin W. ( in Technical Comments )
Abstract » Full Text » Morse, Daniel P. ( in Reports )
Abstract » Full Text » Mosley-Thompson, E. ( in Reports )
Abstract » Full Text » Mouillet-Richard, S. ( in Reports )
Abstract » Full Text » Murray, B. ( in Reports )
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N

Abstract » Full Text » Neelands, Torben ( in Reports )
Abstract » Full Text » Nguyen, Linh P. ( in Research Articles )
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O

Summary » Osborne, Ian S. ( in Editors' Choice: Highlights of the recent literature )
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P

Full Text » Pahlow, Markus ( in Technical Comments )
Abstract » Full Text » Park, D. ( in Reports )
Abstract » Full Text » Paul, Eldor A. ( in Reports )
Abstract » Full Text » Pellicena, Patricia ( in Reports )
Summary » Full Text » Pennisi, Elizabeth ( in News Focus )
Abstract » Full Text » Portereiko, Michael ( in Reports )
Summary » Full Text » Prather, Randall S. ( in Perspectives )
Abstract » Full Text » Pribnow, David ( in Reports )
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R

Abstract » Full Text » Redecker, Dirk ( in Reports )
Full Text » Riebesell, Ulf ( in Technical Comments )
Abstract » Full Text » Robertson, G. Philip ( in Reports )
Full Text » Ross, Andy ( in Technical Comments )
Letters » Ross, Peter S. ( in Letters )
Summary » Full Text » Rowen, Lee ( in Policy Forum )
Abstract » Full Text » Rudnick, Roberta L. ( in Reports )
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S

Summary » Full Text » Schilling, Govert ( in News of the Week )
Abstract » Full Text » Schindler, Thomas ( in Reports )
Abstract » Full Text » Schlote, Wolfgang ( in Reports )
Abstract » Full Text » Seeburg, Peter H. ( in Reports )
Summary » Full Text » Service, Robert F. ( in News of the Week )
Abstract » Full Text » Shackleton, Nicholas J. ( in Research Articles )
Abstract » Full Text » Sham, L. J. ( in Reports )
Abstract » Full Text » Singer, Wolf ( in Reports )
Abstract » Full Text » Smith, W. L. ( in Reports )
Abstract » Full Text » Sprengel, Rolf ( in Reports )
Abstract » Full Text » Spudich, Elena N. ( in Research Articles )
Abstract » Full Text » Spudich, John L. ( in Research Articles )
Abstract » Full Text » Steel, D. G. ( in Reports )
Summary » Full Text » Steinzor, Rena I. ( in Books )
Abstract » Full Text » Storck, Thorsten ( in Reports )
Abstract » Full Text » Suzuki, Marcelino T. ( in Research Articles )
Summary » Szuromi, Phil D. ( in Editors' Choice: Highlights of the recent literature )
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T

Abstract » Full Text » Tarassov, I. A. ( in Reports )
Letters » Teich, Albert H. ( in Letters )
Abstract » Full Text » Thompson, L. G. ( in Reports )
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U

Summary » Uppenbrink, Julia ( in Editors' Choice: Highlights of the recent literature )
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V

Summary » Full Text » Vogelstein, Bert ( in Tech.Sight )
Letters » Vos, Joseph G. ( in Letters )
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W

Summary » Full Text » Wong, Gane K. S. ( in Policy Forum )
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Y

Summary » Full Text » Yan, Hai ( in Tech.Sight )
Abstract » Full Text » Yao, T. ( in Reports )
Abstract » Full Text » Yen, A. S. ( in Reports )
Abstract » Full Text » Yin, Qingzhu ( in Reports )
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Z

Full Text » Zhang, Jia-Zhong ( in Technical Comments )
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