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21 April 2000
Vol 288, Issue 5465, Pages 389-564

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A

Abstract » Full Text » Albertini, R. J. ( in Reports )
Summary » Full Text » Andersen, Johannes ( in Policy Forum )
Abstract » Full Text » Anderson, Philip W. ( in Viewpoint )
Summary » Full Text » Angel, Roger ( in Tech.Sight )
Abstract » Full Text » Antoch, Marina P. ( in Research Articles )
Abstract » Full Text » Apostolopoulos, Vasso ( in Reports )
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B

Abstract » Full Text » Barrick, Reese E. ( in Reports )
Abstract » Full Text » Bartsiokas, Antonis ( in Reports )
Full Text » Beckman, Joseph S. ( in Technical Comments )
Abstract » Full Text » Bennoune, K. Y. ( in Reports )
Full Text » Birgeneau, Robert J. ( in Editorial )
Abstract » Full Text » Bower, C. ( in Reports )
Full Text » Bruijn, Lucie I. ( in Technical Comments )
Full Text » Burlingame, Al ( in Technical Comments )
Abstract » Full Text » Butler, J. H. ( in Reports )
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C

Summary » Chin, Gilbert J. ( in Editors' Choice: Highlights of the recent literature )
Abstract » Full Text » Choi, Hyoung Joon ( in Reports )
Full Text » Cleveland;, Don W. ( in Technical Comments )
Letters » Clifford;, David ( in Letters )
Abstract » Full Text » Corper, Adam L. ( in Reports )
Full Text » Corson, Laura B. ( in Technical Comments )
Full Text » Crow, John P. ( in Technical Comments )
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D

Abstract » Full Text » Davis, Barbara L. ( in Reports )
Abstract » Full Text » DeCelles, P. G. ( in Reports )
Abstract » Full Text » Dennis, Patrick P. ( in Reports )
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E

Abstract » Full Text » Ebersold, Melanie ( in Reports )
Abstract » Full Text » Ebhardt, Holger ( in Reports )
Abstract » Full Text » Eddy, Sean R. ( in Reports )
Abstract » Full Text » Elkins, J. W. ( in Reports )
Summary » Full Text » Enserink, Martin ( in News of the Week )
Full Text » Estévez;, Alvaro G. ( in Technical Comments )
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F

Abstract » Full Text » Finette, B. A. ( in Reports )
Abstract » Full Text » Fisher, Paul E. ( in Reports )
Abstract » Full Text » Fleming, L. ( in Reports )
Abstract » Full Text » Forero, M. ( in Reports )
Summary » Full Text » Fugate, Bob ( in Tech.Sight )
Abstract » Full Text » Fuhrer, M. S. ( in Reports )
Letters » Furton;, Edward J. ( in Letters )
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G

Abstract » Full Text » Garcia, K. Christopher ( in Reports )
Abstract » Full Text » Garrett, Wendy S. ( in Reports )
Letters » Gartner, Suzanne ( in Letters )
Abstract » Full Text » Gehrels, G. E. ( in Reports )
Abstract » Full Text » Girotto, Vittorio ( in Reports )
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H

Abstract » Full Text » Hammer, Michael ( in Reports )
Summary » Hanson, Brooks ( in Editors' Choice: Highlights of the recent literature )
Abstract » Full Text » Homans, A. C. ( in Reports )
Full Text » Huang, Lan ( in Technical Comments )
Summary » Hurtley, Stella M. ( in Editors' Choice: Highlights of the recent literature )
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I

Abstract » Full Text » Ihm, Jisoon ( in Reports )
Abstract » Full Text » Inaba, Kayo ( in Reports )
Summary » Full Text » Irion, Robert ( in News Focus )
Summary » Full Text » Irion, Robert ( in News Focus )
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J

Abstract » Full Text » Johnson-Laird, P. N. ( in Reports )
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K

Letters » Kaasik, Tõnis ( in Letters )
Summary » Full Text » Kaiser, Jocelyn ( in News Focus )
Abstract » Full Text » Kang, Angray S. ( in Reports )
Full Text » Kastner, Marc A. ( in Editorial )
Summary » Full Text » Kerr, Richard A. ( in News of the Week )
Abstract » Full Text » Kleinhammes, A. ( in Reports )
Summary » Full Text » Koenig, Robert ( in News of the Week )
Summary » Full Text » Koenig, Robert ( in News of the Week )
Summary » Full Text » Koenig, Robert ( in News of the Week )
Abstract » Full Text » Kuzmitz, Andrew A. ( in Reports )
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L

Abstract » Full Text » LaReau, B. ( in Reports )
Summary » Full Text » Lawler, Andrew ( in News of the Week )
Abstract » Full Text » Legrenzi, Maria S. ( in Reports )
Abstract » Full Text » Legrenzi, Paolo ( in Reports )
Letters » Lenoir, Noëlle ( in Letters )
Full Text » Liu, Jian ( in Technical Comments )
Abstract » Full Text » Lock, L. T. ( in Reports )
Summary » Full Text » Locke, John L. ( in Perspectives )
Abstract » Full Text » Louie, Steven G. ( in Reports )
Abstract » Full Text » Lowe, Todd M. ( in Reports )
Abstract » Full Text » Lowrey, Phillip L. ( in Research Articles )
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M

Abstract » Full Text » MacNeilage, Peter F. ( in Reports )
Letters » Major, Eugene O. ( in Letters )
Summary » Full Text » Malakoff, David ( in News of the Week )
Letters » Marra, Christina ( in Letters )
Abstract » Full Text » Mazzoni, M. S. C. ( in Reports )
Letters » McArthur, Justin C. ( in Letters )
Abstract » Full Text » McEuen, Paul L. ( in Reports )
Abstract » Full Text » Mellman, Ira ( in Reports )
Abstract » Full Text » Menaker, Michael ( in Research Articles )
Summary » Full Text » Mervis, Jeffrey ( in News of the Week )
Summary » Full Text » Mervis, Jeffrey ( in News Focus )
Abstract » Full Text » Millis, A. J. ( in Review )
Abstract » Full Text » Mondeel, D. J. ( in Reports )
Abstract » Full Text » Montzka, S. A. ( in Reports )
Summary » Full Text » Morell, Virginia ( in News of the Week )
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N

Abstract » Full Text » Nagaosa, N. ( in Review )
Summary » Full Text » Normile, Dennis ( in News Focus )
Abstract » Full Text » Nygård, J. ( in Reports )
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O

Summary » Full Text » Ober, Christopher K. ( in Perspectives )
Abstract » Full Text » Omer, Arina D. ( in Reports )
Abstract » Full Text » Orenstein, J. ( in Review )
Summary » Full Text » Osborne, Ian S. ( in Introduction to special issue )
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P

Summary » Full Text » Pennisi, Elizabeth ( in News of the Week )
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Q

Abstract » Full Text » Quade, J. ( in Reports )
Full Text » Quardokus, Ellen ( in Tech.Sight )
Summary » Full Text » Quigg, Chris ( in Books )
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R

Abstract » Full Text » Ralph, Martin R. ( in Research Articles )
Letters » Rausch, Dianne ( in Letters )
Full Text » Rawitch, Allen B. ( in Tech.Sight )
Summary » Full Text » Robbins, Trevor W. ( in Books )
Letters » Rofer, Cheryl K. ( in Letters )
Summary » Rowan, Linda ( in Editors' Choice: Highlights of the recent literature )
Abstract » Full Text » Russell, Anthony G. ( in Reports )
Abstract » Full Text » Russell, Dale A. ( in Reports )
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S

Abstract » Full Text » Sachdev, Subir ( in Review )
Abstract » Full Text » Scott, Christopher A. ( in Reports )
Summary » Full Text » Service, Robert F. ( in News Focus )
Abstract » Full Text » Shih, L. ( in Reports )
Abstract » Full Text » Shimoda, H. ( in Reports )
Abstract » Full Text » Shimomura, Kazuhiro ( in Research Articles )
Full Text » Shmaefsky, Brian R. ( in Tech.Sight )
Abstract » Full Text » Sinha, S. ( in Reports )
Full Text » Smith, Orla ( in Perspectives )
Abstract » Full Text » Spivakovsky, C. M. ( in Reports )
Abstract » Full Text » Spurlin, M. ( in Reports )
Abstract » Full Text » Steinman, Ralph M. ( in Reports )
Abstract » Full Text » Stoskopf, Michael K. ( in Reports )
Abstract » Full Text » Stratmann, Thomas ( in Reports )
Summary » Sugden, Andrew M. ( in Editors' Choice: Highlights of the recent literature )
Summary » Szuromi, Phil D. ( in Editors' Choice: Highlights of the recent literature )
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T

Abstract » Full Text » Takahashi, Joseph S. ( in Research Articles )
Abstract » Full Text » Tang, X.-P. ( in Reports )
Abstract » Full Text » Teyton, Luc ( in Reports )
Abstract » Full Text » Tokura, Y. ( in Review )
Abstract » Full Text » Turley, Shannon J. ( in Reports )
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U

Abstract » Full Text » Unternaehrer, Julia ( in Reports )
Summary » Uppenbrink, Julia ( in Editors' Choice: Highlights of the recent literature )
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V

Summary » Vinson, Valda ( in Editors' Choice: Highlights of the recent literature )
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W

Letters » Waclawek, Zofia ( in Letters )
Full Text » Williamson, Toni L. ( in Technical Comments )
Abstract » Full Text » Wilson, Ian A. ( in Reports )
Abstract » Full Text » Wu, Y. ( in Reports )
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Y

Abstract » Full Text » Yamazaki, Shin ( in Research Articles )
Abstract » Full Text » Yoon, Young-Gui ( in Reports )
Summary » Full Text » Young, Michael W. ( in Perspectives )
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Z

Abstract » Full Text » Zemenides, Peter D. ( in Research Articles )
Abstract » Full Text » Zettl, A. ( in Reports )
Abstract » Full Text » Zhou, O. ( in Reports )
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