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17 March 2000
Vol 287, Issue 5460, Pages 1877-2104

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A

Letters » Abbo, Shahal ( in Letters )
Abstract » Full Text » Abdurashidova, Gulnara ( in Reports )
Summary » Full Text » Agnew, Bruce ( in News )
Full Text » Ahern, Kevin ( in Tech.Sight )
Abstract » Full Text » Allsop, Aileen ( in Review )
Abstract » Full Text » Aze, Yoshiya ( in Reports )
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B

Summary » Full Text » Balter, Michael ( in News Focus )
Summary » Full Text » Balter, Michael ( in News Focus )
Summary » Full Text » Barton, John H. ( in Policy Forum )
Full Text » Bellott, Emile M. ( in Tech.Sight )
Letters » Benbrook, Charles ( in Letters )
Abstract » Full Text » Bertozzi, Carolyn R. ( in Reports )
Abstract » Full Text » Biamonti, Giuseppe ( in Reports )
Full Text » Bloom, Floyd E. ( in Editorial )
Letters » Brush, Stephen ( in Letters )
Abstract » Full Text » Buta, Martin R. ( in Reports )
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C

Abstract » Full Text » Caballero, Otávia L. ( in Reports )
Abstract » Full Text » Castner, Stacy A. ( in Reports )
Abstract » Full Text » Chen, Huiyuan ( in Reports )
Summary » Full Text » Chi, Tian H. ( in Perspectives )
Abstract » Full Text » Chiasson, Bernard J. ( in Reports )
Summary » Chin, Gilbert J. ( in Editors' Choice: Highlights of the recent literature )
Summary » Full Text » Cho, Adrian ( in News of the Week )
Summary » Full Text » Cipra, Barry ( in News Focus )
Full Text » Clay, Keith ( in Technical Comments )
Abstract » Full Text » Coles, Brenda L. K. ( in Reports )
Summary » Full Text » Crabtree, Gerald R. ( in Perspectives )
Summary » Full Text » Cundall, David ( in Perspectives )
Summary » Full Text » Cynader, Max ( in Perspectives )
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D

Abstract » Full Text » Deganuto, Marta ( in Reports )
Abstract » Full Text » Drews, Jürgen ( in Review )
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E

Abstract » Full Text » Eagleman, David M. ( in Reports )
Abstract » Full Text » Eguchi, Naomi ( in Reports )
Abstract » Full Text » Eleff, Scott M. ( in Reports )
Abstract » Full Text » Elia, Andrew J. ( in Reports )
Summary » Full Text » Enserink, Martin ( in News )
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F

Abstract » Full Text » Falaschi, Arturo ( in Reports )
Abstract » Full Text » Fliss, Makiko S. ( in Reports )
Abstract » Full Text » Folks, Liesl ( in Reports )
Abstract » Full Text » Fujiwara, Yuzo ( in Reports )
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G

Letters » Garcia-Barrios, Luis ( in Letters )
Abstract » Full Text » Giacca, Mauro ( in Reports )
Abstract » Full Text » Gibbs, Jackson B. ( in Review )
Abstract » Full Text » Goldman-Rakic, Patricia S. ( in Reports )
Summary » Full Text » Greene, Harry W. ( in Perspectives )
Abstract » Full Text » Guo, Yueling ( in Reports )
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H

Summary » Full Text » Hagmann, Michael ( in News of the Week )
Summary » Full Text » Hagmann, Michael ( in News of the Week )
Summary » Hanson, Brooks ( in Editors' Choice: Highlights of the recent literature )
Abstract » Full Text » Hartmann, Dennis L. ( in Reports )
Abstract » Full Text » Hartwig, John F. ( in Reports )
Abstract » Full Text » Hirata, Masakazu ( in Reports )
Full Text » Holah, Jenny ( in Technical Comments )
Abstract » Full Text » Honda, Yoshihito ( in Reports )
Abstract » Full Text » Horsford, D. Jonathan ( in Reports )
Summary » Hurtley, Stella M. ( in Editors' Choice: Highlights of the recent literature )
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I

Summary » Full Text » Imhof, Peter ( in Books )
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J

Abstract » Full Text » Jacobs, Louis L. ( in Reports )
Abstract » Full Text » Jen, Jin ( in Reports )
Abstract » Full Text » Jia, Chengguo ( in Reports )
Summary » Full Text » Jones, William D. ( in Perspectives )
Summary » Full Text » Jung, Günther ( in Tech.Sight )
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K

Abstract » Full Text » Kabashima, Kenji ( in Reports )
Abstract » Full Text » Kelly, Robin ( in Reports )
Abstract » Full Text » Kicklighter, David ( in Reports )
Abstract » Full Text » Kimura, Kazushi ( in Reports )
Abstract » Full Text » Kitamura, Tsugio ( in Reports )
Abstract » Full Text » Kittel, Timothy ( in Reports )
Abstract » Full Text » Kivelson, M. G. ( in Reports )
Abstract » Full Text » Klima, Raffaella ( in Reports )
Abstract » Full Text » Kobayashi, Takuya ( in Reports )
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L

Letters » Laubichler, Manfred D. ( in Letters )
Summary » Full Text » Lawler, Andrew ( in News of the Week )
Letters » Lin, Jianyi ( in Letters )
Abstract » Full Text » Lu, Wenjun ( in Reports )
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M

Summary » Full Text » Mackenzie, Dana ( in News Focus )
Abstract » Full Text » Maloney, Eric D. ( in Reports )
Summary » Full Text » Marshall, Eliot ( in News )
Summary » Full Text » Marshall, Eliot ( in News of the Week )
Abstract » Full Text » Matsuoka, Toshiyuki ( in Reports )
Summary » Full Text » McCall, Benjamin J. ( in Perspectives )
Abstract » Full Text » McGuire, A. David ( in Reports )
Abstract » Full Text » McInnes, Roderick R. ( in Reports )
Abstract » Full Text » Melillo, Jerry ( in Reports )
Summary » Mervis, Jeffrey ( in Introduction to special issue )
Abstract » Full Text » Mizoguchi, Akira ( in Reports )
Abstract » Full Text » Moser, Andreas ( in Reports )
Abstract » Full Text » Murata, Takahiko ( in Reports )
Abstract » Full Text » Murray, C. B. ( in Reports )
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N

Abstract » Full Text » Nagai, Hiroichi ( in Reports )
Abstract » Full Text » Narumiya, Shuh ( in Reports )
Abstract » Full Text » Neilson, Ron ( in Reports )
Summary » Nelson, John ( in Editors' Choice: Highlights of the recent literature )
Letters » Nigh, Ronald ( in Letters )
Summary » Full Text » Normile, Dennis ( in News )
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O

Abstract » Full Text » O'Nions, R. Keith ( in Reports )
Abstract » Full Text » Odom, Audrey R. ( in Reports )
Abstract » Full Text » Ojima, Dennis ( in Reports )
Summary » Full Text » Oka, Takeshi ( in Perspectives )
Letters » Ortega-Paczka, Rafael ( in Letters )
Summary » Osborne, Ian S. ( in Editors' Choice: Highlights of the recent literature )
Abstract » Full Text » Oyamada, Juzo ( in Reports )
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P

Abstract » Full Text » Parton, William ( in Reports )
Letters » Perales;, Hugo R. ( in Letters )
Abstract » Full Text » Piao, Dongguo ( in Reports )
Abstract » Full Text » Polcyn, Michael J. ( in Reports )
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R

Summary » Full Text » Rademann, Jörg ( in Tech.Sight )
Abstract » Full Text » Reich, Michael R. ( in Viewpoint )
Abstract » Full Text » Reynolds, Ben C. ( in Reports )
Abstract » Full Text » Rieppel, Olivier ( in Reports )
Abstract » Full Text » Riva, Silvano ( in Reports )
Abstract » Full Text » Rizzo, Brian ( in Reports )
Summary » Full Text » Roberts, Leslie ( in News of the Week )
Abstract » Full Text » Rosamond, John ( in Review )
Abstract » Full Text » Rosenbloom, Nan ( in Reports )
Full Text » Rowan, Linda ( in Tech.Sight )
Letters » Rubin, Baruch ( in Letters )
Abstract » Full Text » Running, Steven ( in Reports )
Abstract » Full Text » Russell, C. T. ( in Reports )
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S

Full Text » Saikkonen, Kari ( in Technical Comments )
Abstract » Full Text » Sander, Chris ( in Viewpoint )
Abstract » Full Text » Saxon, Eliana ( in Reports )
Abstract » Full Text » Schimel, David ( in Reports )
Abstract » Full Text » Schlecht, Sabine ( in Reports )
Abstract » Full Text » Schreiber, Stuart L. ( in Review )
Full Text » Seffens, William ( in Tech.Sight )
Summary » Full Text » Seife, Charles ( in News Focus )
Summary » Full Text » Seife, Charles ( in News Focus )
Abstract » Full Text » Sejnowski, Terrence J. ( in Reports )
Abstract » Full Text » Semple, Thomas C. ( in Reports )
Summary » Full Text » Service, Robert F. ( in News )
Summary » Full Text » Service, Robert F. ( in News )
Summary » Full Text » Service, Robert F. ( in News of the Week )
Abstract » Full Text » Sidransky, David ( in Reports )
Summary » Smith, H. Jesse ( in Editors' Choice: Highlights of the recent literature )
Letters » Snyderman, Ralph ( in Letters )
Abstract » Full Text » Stahlberg, Alke ( in Reports )
Letters » Steinberg;, Jacob J. ( in Letters )
Summary » Full Text » Stokstad, Erik ( in News Focus )
Abstract » Full Text » Stryker, Michael P. ( in Reports )
Abstract » Full Text » Sugimoto, Yukihiko ( in Reports )
Abstract » Full Text » Sun, Shouheng ( in Reports )
Abstract » Full Text » Sykes, Martin ( in Reports )
Summary » Szuromi, Phillip D. ( in Editors' Choice: Highlights of the recent literature )
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T

Abstract » Full Text » Takahashi, Yoshimasa ( in Reports )
Abstract » Full Text » Tanaka, Hiroyuki ( in Reports )
Abstract » Full Text » Tchernov, Eitan ( in Reports )
Abstract » Full Text » Thornton, Peter ( in Reports )
Abstract » Full Text » Tian, Hanqin ( in Reports )
Abstract » Full Text » Trachtenberg, Joshua T. ( in Reports )
Abstract » Full Text » Trepel, Christopher ( in Reports )
Abstract » Full Text » Tropepe, Vincent ( in Reports )
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U

Summary » Uppenbrink, Julia ( in Introduction to special issue )
Abstract » Full Text » Urade, Yoshihiro ( in Reports )
Abstract » Full Text » Usadel, Henning ( in Reports )
Abstract » Full Text » Ushikubi, Fumitaka ( in Reports )
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V

Abstract » Full Text » van der Kooy, Derek ( in Reports )
Summary » Vinson, Valda ( in Editors' Choice: Highlights of the recent literature )
Summary » Full Text » Vogel, Gretchen ( in News of the Week )
Summary » Full Text » von Baeyer, Hans Christian ( in Books )
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W

Letters » Waltar, Alan E. ( in Letters )
Abstract » Full Text » Weller, Dieter ( in Reports )
Abstract » Full Text » Wente, Susan R. ( in Reports )
Abstract » Full Text » Williams, Graham V. ( in Reports )
Abstract » Full Text » Wu, Li ( in Reports )
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Y

Abstract » Full Text » York, John D. ( in Reports )
Abstract » Full Text » Yoshida, Nobuaki ( in Reports )
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Z

Abstract » Full Text » Zaher, Hussam ( in Reports )
Abstract » Full Text » Zhu, Xiang-Kun ( in Reports )
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