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21 November 1997
Vol 278, Issue 5342, Pages 1369-1532

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A

Abstract » Full Text » Aeppli, G. ( in Reports )
Letters » Ahern, F. ( in Letters )
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B

Abstract » Full Text » Backhaus, S. ( in Reports )
Summary » Full Text » Balter, Michael ( in Research News )
Summary » Full Text » Barinaga, Marcia ( in Research News )
Abstract » Full Text » Barker, Philip ( in Research Articles )
Abstract » Full Text » Baron, Aimee ( in Reports )
Abstract » Full Text » Bassinot, Franck ( in Reports )
Abstract » Full Text » Beaufort, Luc ( in Reports )
Full Text » Belonoshko;, Anatoly B. ( in Technical Comments )
Letters » Berg, S. ( in Letters )
Full Text » Berger, A. ( in Technical Comments )
Abstract » Full Text » Billingsley, James M. ( in Reports )
Abstract » Full Text » Binderbauer, Michl W. ( in Articles )
Abstract » Full Text » Blumberg, G. ( in Reports )
Full Text » Bonner, Robert F. ( in Tech.Sight )
Abstract » Full Text » Boswell, Steven L. ( in Reports )
Abstract » Full Text » Bush, Daniel R. ( in Reports )
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C

Abstract » Full Text » Caliendo, Angela M. ( in Reports )
Abstract » Full Text » Camberlin, Pierre ( in Reports )
Abstract » Full Text » Cayre, Olivia ( in Reports )
Summary » Full Text » Chakravarty, Sudip ( in Perspectives )
Abstract » Full Text » Choe, Hyeryun ( in Reports )
Full Text » Chuaqui, Rodgrigo ( in Tech.Sight )
Abstract » Full Text » Cline, Kenneth ( in Reports )
Full Text » Cole, Kristina ( in Tech.Sight )
Abstract » Full Text » Collard, John G. ( in Reports )
Abstract » Full Text » Constantine, Andrew ( in Reports )
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D

Abstract » Full Text » Davis, J. C. ( in Reports )
Abstract » Full Text » Desjardins, Elizabeth ( in Reports )
Abstract » Full Text » Doranz, Benjamin J. ( in Reports )
Full Text » Dubrovinsky;, L. S. ( in Technical Comments )
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E

Abstract » Full Text » Eglinton, Geoffrey ( in Research Articles )
Summary » Emmert, Mark A. ( in Editorial )
Full Text » Emmert-Buck, Michael ( in Tech.Sight )
Abstract » Full Text » Endres, Michael J. ( in Reports )
Abstract » Full Text » Ermler, Ulrich ( in Reports )
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F

Letters » Falek, Arthur ( in Letters )
Summary » Full Text » Farquhar, Graham D. ( in Perspectives )
Abstract » Full Text » Farzan, Michael ( in Reports )
Letters » Feldman, M. W. ( in Letters )
Summary » Full Text » Ferry, James G. ( in Perspectives )
Abstract » Full Text » Flannery, Timothy F. ( in Reports )
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G

Abstract » Full Text » Gerard, Craig ( in Reports )
Abstract » Full Text » Gerard, Norma P. ( in Reports )
Full Text » Goldstein, Seth ( in Tech.Sight )
Abstract » Full Text » Goubeaud, Marcel ( in Reports )
Abstract » Full Text » Grabarse, Wolfgang ( in Reports )
Letters » Greenspan;, Stanley I. ( in Letters )
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H

Abstract » Full Text » Haggarty, Beth ( in Reports )
Abstract » Full Text » Harkness, Douglas D. ( in Research Articles )
Abstract » Full Text » Hayden, S. M. ( in Reports )
Abstract » Full Text » Hordijk, Peter L. ( in Reports )
Abstract » Full Text » Hoxie, James A. ( in Reports )
Abstract » Full Text » Huang, Yongsong ( in Research Articles )
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J

Abstract » Full Text » Jaffer, Salman ( in Reports )
Letters » Jarvik;, Lissy F. ( in Letters )
Letters » Johansson and, B. ( in Letters )
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K

Abstract » Full Text » Kadowaki, K. ( in Reports )
Abstract » Full Text » Kalams, Spyros A. ( in Reports )
Letters » Kamin;, Leon J. ( in Letters )
Abstract » Full Text » Kang, Moonsoo ( in Reports )
Abstract » Full Text » Kendziora, C. ( in Reports )
Summary » Full Text » Kerr, Richard A. ( in Research News )
Abstract » Full Text » Khelifa, Leila Ben ( in Research Articles )
Abstract » Full Text » Klein, M. V. ( in Reports )
Abstract » Full Text » Kolson, Dennis L. ( in Reports )
Abstract » Full Text » Kool, Lesley ( in Reports )
Abstract » Full Text » Kulda, J. ( in Reports )
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L

Abstract » Full Text » Labeyrie, Laurent ( in Reports )
Abstract » Full Text » Lagally, M. G. ( in Reports )
Abstract » Full Text » Lancelot, Yves ( in Reports )
Summary » Full Text » Lawler, Andrew ( in News & Comment )
Summary » Full Text » Lawler, Andrew ( in News & Comment )
Full Text » Liotta, Lance A. ( in Tech.Sight )
Abstract » Full Text » Loshak, A. ( in Reports )
Full Text » Loutre;, M. F. ( in Technical Comments )
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M

Summary » Full Text » Mackenzie, Dana ( in News & Comment )
Summary » Full Text » Mackenzie, Dana ( in News & Comment )
Summary » Full Text » Mahlman, J. D. ( in Policy Forum )
Abstract » Full Text » Marcon, Luisa ( in Reports )
Summary » Full Text » Marshall, Eliot ( in News & Comment )
Abstract » Full Text » Martienssen, Rob ( in Reports )
Abstract » Full Text » Martin, Kathleen A. ( in Reports )
Abstract » Full Text » Mason, T. E. ( in Reports )
Letters » McClearn and, G. E. ( in Letters )
Full Text » McIntyre;, Andrew ( in Technical Comments )
Summary » Full Text » Mervis, Jeffrey ( in News & Comment )
Abstract » Full Text » Michiels, Frits ( in Reports )
Abstract » Full Text » Monkhorst, Hendrik J. ( in Articles )
Abstract » Full Text » Mook, H. A. ( in Reports )
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O

Abstract » Full Text » O'Brien, Peter J. ( in Reports )
Summary » Full Text » Ogden, John C. ( in Perspectives )
Abstract » Full Text » Olago, Daniel O. ( in Research Articles )
Abstract » Full Text » Oomen, Lauran C. J. M. ( in Reports )
Letters » Otto;, S. P. ( in Letters )
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P

Abstract » Full Text » Packard, R. E. ( in Reports )
Letters » Pedersen, N. L. ( in Letters )
Abstract » Full Text » Pereverzev, S. V. ( in Reports )
Abstract » Full Text » Perrott, R. Alan ( in Research Articles )
Full Text » Peters, Richard ( in Tech.Sight )
Full Text » Peters, Richard ( in Tech.Sight )
Full Text » Peters, Richard ( in Tech.Sight )
Full Text » Peters, Richard ( in Tech.Sight )
Letters » Petrill, S. A. ( in Letters )
Letters » Plomin;, R. ( in Letters )
Full Text » Pohida, Thomas ( in Tech.Sight )
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Q

Abstract » Full Text » Qin, X. R. ( in Reports )
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R

Summary » Full Text » Redfearn, Judy ( in News & Comment )
Summary » Full Text » Redfearn, Judy ( in News & Comment )
Abstract » Full Text » Rich, Thomas H. ( in Reports )
Abstract » Full Text » Roberts, Callum M. ( in Reports )
Abstract » Full Text » Robinson, James ( in Reports )
Abstract » Full Text » Rosenberg, Eric S. ( in Reports )
Abstract » Full Text » Rostoker, Norman ( in Articles )
Summary » Full Text » Roush, Wade ( in Research News )
Summary » Full Text » Roush, Wade ( in Research News )
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S

Abstract » Full Text » Sax, Paul E. ( in Reports )
Abstract » Full Text » Settles, A. Mark ( in Reports )
Abstract » Full Text » Shima, Seigo ( in Reports )
Full Text » Sikorski, Robert ( in Tech.Sight )
Full Text » Sikorski, Robert ( in Tech.Sight )
Full Text » Sikorski, Robert ( in Tech.Sight )
Full Text » Sikorski, Robert ( in Tech.Sight )
Abstract » Full Text » Sodroski, Joseph ( in Reports )
Abstract » Full Text » Street-Perrott, F. Alayne ( in Research Articles )
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T

Summary » Full Text » Taylor, Kenneth L. ( in Book Reviews )
Abstract » Full Text » ten Klooster, Jean Paul ( in Reports )
Abstract » Full Text » Thauer, Rudolf K. ( in Reports )
Abstract » Full Text » Trimble, Stanley W. ( in Reports )
Abstract » Full Text » Turner, Julie D. ( in Reports )
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V

Abstract » Full Text » van der Kammen, Rob A. ( in Reports )
Abstract » Full Text » van Klaveren, Nicholas ( in Reports )
Abstract » Full Text » Vickers-Rich, Patricia ( in Reports )
Abstract » Full Text » Vincent, Edith ( in Reports )
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W

Abstract » Full Text » Walker, Bruce D. ( in Reports )
Summary » Full Text » Watson, Andrew ( in Research News )
Summary » Full Text » Weiss, Peter ( in News & Comment )
Summary » Full Text » Wickelgren, Ingrid ( in Research News )
Summary » Full Text » Wickelgren, Ingrid ( in Research News )
Summary » Full Text » Williams, Nigel ( in News & Comment )
Summary » Full Text » Wuethrich, Bernice ( in Research News )
Abstract » Full Text » Wyatt, Richard ( in Reports )
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Y

Abstract » Full Text » Yonetani, Ann ( in Reports )
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