Note to users. If you're seeing this message, it means that your browser cannot find this page's style/presentation instructions -- or possibly that you are using a browser that does not support current Web standards. Find out more about why this message is appearing, and what you can do to make your experience of our site the best it can be.

Science 27 February 2009:
Vol. 323. no. 5918, pp. 1178 - 1179
DOI: 10.1126/science.1170744
Prev | Table of Contents | Next

Perspectives

APPLIED PHYSICS:
Looking Below the Surface

Andreas J. Heinrich

Scanning tunneling microscopy can now be used to determine electronic properties of bulk materials.

Almaden Research Center, IBM Research Division, San Jose, CA 95120, USA. E-mail: heinrich{at}almaden.ibm.com

Read the Full Text

To Advertise     Find Products

Science. ISSN 0036-8075 (print), 1095-9203 (online)