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Science 18 July 2008:
Vol. 321. no. 5887, pp. 352 - 353
DOI: 10.1126/science.1161183
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Perspectives

APPLIED PHYSICS:
Focus on X-ray Diffraction

Henry N. Chapman

The marriage of scanning x-ray microscopy with diffractive imaging provides a route to dramatic increases in spatial resolution.

Centre for Free-Electron Laser Science, University of Hamburg and Deutsches Elektronen-Synchrotron, Notkestrasse 85, 22607 Hamburg, Germany. E-mail: henry.chapman{at}desy.de

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Science. ISSN 0036-8075 (print), 1095-9203 (online)