Note to users. If you're seeing this message, it means that your browser cannot find this page's style/presentation instructions -- or possibly that you are using a browser that does not support current Web standards. Find out more about why this message is appearing, and what you can do to make your experience of our site the best it can be.


Science 4 February 2005:
Vol. 307. no. 5710, pp. 682 - 683
DOI: 10.1126/science.1108380

Perspectives

Also see the archival list of Science's Compass: Enhanced Perspectives

OCEAN SCIENCE:
Enhanced: The Ocean's Seismic Hum

Sharon Kedar and Frank H. Webb

Since the early 20th century, seismometers have detected a continuous, low-frequency seismic "hum" that is caused by wave-wave interactions in the ocean. In their Perspective, Kedar and Webb review advances reported at a recent meeting toward understanding the origins of this hum (which is referred to as ocean microseisms) and utilizing it in Earth science applications. For example, ocean microseisms can be used to assess El Niño conditions for times when few ocean data were available. They can also be used to monitor temporal changes in Earth's upper crust that cannot be detected with conventional seismology methods. Space- and airborne instruments may help to identify more clearly those regions where ocean microseisms are generated.


The authors are at the Jet Propulsion Laboratory, 4800 Oak Grove Drive, Pasadena, CA 91109, USA. E-mail: sharon.kedar{at}jpl.nasa.gov, frank.webb{at}jpl.nasa.gov

Read the Full Text


THIS ARTICLE HAS BEEN CITED BY OTHER ARTICLES:
Postseismic Relaxation Along the San Andreas Fault at Parkfield from Continuous Seismological Observations.
F. Brenguier, M. Campillo, C. Hadziioannou, N. M. Shapiro, R. M. Nadeau, and E. Larose (2008)
Science 321, 1478-1481
   Abstract »    Full Text »    PDF »
Multidecadal Climate-induced Variability in Microseisms.
R. C. Aster, D. E. McNamara, and P. D. Bromirski (2008)
Seismological Research Letters 79, 194-202
   Full Text »    PDF »



To Advertise     Find Products


Science. ISSN 0036-8075 (print), 1095-9203 (online)