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Science 28 June 1996:
Vol. 272. no. 5270, pp. 1849 - 0
DOI:

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Future device applications will require an understanding of electron transport through nanostructures or even atomic structures. Yazdani et al. (p. 1921; see the Perspective by Muller and Reed, p. 1901) measured the electrical resistance of a single xenon atom or a pair of xenon atoms held between a scanning tunneling microscope tip and a nickel surface. Theoretical calculations accurately predict the observed resistivity and show that off-resonant conduction occurs through the tail of the 6s electronic level.




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Science. ISSN 0036-8075 (print), 1095-9203 (online)