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Science 27 October 2006:
Vol. 314. no. 5799, pp. 601 - 602
DOI: 10.1126/science.1133497
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Perspectives

APPLIED PHYSICS:
High-Speed Atomic Force Microscopy

Paul K. Hansma1, Georg Schitter1, Georg E. Fantner1, Craig Prater2

Innovations in engineering, miniaturization, and control-system design have the potential to allow faster imaging by atomic force microscopes.

1P. Hansma, G. Schitter, and G. Fantner are in the Department of Physics, University of California, Santa Barbara, CA 93106, USA.

2C. Prater is at Veeco Instruments Inc., Santa Barbara, CA 93117, USA. E-mail: prasant{at}physics.ucsb.edu

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Science. ISSN 0036-8075 (print), 1095-9203 (online)