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Science 31 October 2003:
Vol. 302. no. 5646, pp. 846 - 849
DOI: 10.1126/science.1089785
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Reports

Direct Atom-Resolved Imaging of Oxides and Their Grain Boundaries

Zaoli Zhang, Wilfried Sigle, Fritz Phillipp, Manfred Rühle*

Using high-resolution transmission electron microscopy, we obtained structure images of strontium titanate (SrTiO3) with a clearly resolved oxygen sublattice along different crystallographic directions in the bulklattice and for a {Sigma}3 tilt grain boundary. Comparison with image simulations showed that the grain boundary contains oxygen vacancies. Measurements of atom displacements near the grain boundary revealed close correspondence with theoretical calculations.

Max-Planck-Institut für Metallforschung, Heisenbergstraße 3, D-70569 Stuttgart, Germany.

* To whom correspondence should be addressed. E-mail: ruehle{at}mf.mpg.de

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THIS ARTICLE HAS BEEN CITED BY OTHER ARTICLES:
Atomic-Resolution Measurement of Oxygen Concentration in Oxide Materials.
C. L. Jia and K. Urban (2004)
Science 303, 2001-2004
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