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Science 6 September 1996: Vol. 273. no. 5280, pp. 1371 - 1373 DOI: 10.1126/science.273.5280.1371
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Reports
Threefold Electron Scattering on Graphite Observed with
C60-Adsorbed STM Tips
K. F. Kelly,
D. Sarkar,
G. D. Hale,
S. J. Oldenburg,
N. J. Halas
*
The scanning tunneling microscope (STM) has been used to
observe threefold symmetric electron scattering from point defects on a
graphite surface. These theoretically predicted electronic
perturbations could not be observed with a bare metal tip but could
only be imaged when a fullerene (C60) molecule was adsorbed
onto the tunneling region (apex) of an STM tip. Functionalizing an STM
tip with an appropriate molecular adsorbate alters the density of
states near the Fermi level of the tip and changes its imaging
characteristics.
Department of Electrical and Computer Engineering, Rice Quantum
Institute, and Center for Nanoscale Science and Technology, Rice
University, Post Office Box 1892, Houston, TX 77251, USA.
*
To whom correspondence should be addressed.
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