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Science 30 October 1992:
Vol. 258. no. 5083, pp. 775 - 778
DOI: 10.1126/science.1439784
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Articles

Science, Vol 258, Issue 5083, 775-778
Copyright © 1992 by American Association for the Advancement of Science

articles

Resonance-enhanced x-rays in thin films: a structure probe for membranes and surface layers

J Wang, MJ Bedzyk, and M Caffrey

Department of Chemistry, Ohio State University, Columbus 43210.

An x-ray resonance effect in an organic thin film on an x-ray reflecting mirror is reported. The resonance effect is the result of interference between reflected and refracted x-rays at the air-organic thin film interface and occurs at incident angles slightly above the critical angle of the film. In excellent agreement with theory, the primary resonant x-ray electric field that is confined in the organic thin film is approximately 20 times as intense as the electric field of the incident beam when measured at a position close to the center of the film. Resonance-enhanced x-rays can be used to characterize the internal structure of Langmuir-Blodgett thin film membranes. This effect may also find use in x-ray-based thin film devices and in the structural analysis of adlayers and surfaces that have thus far proved difficult, if not impossible, to study because of sensitivity limitations.


THIS ARTICLE HAS BEEN CITED BY OTHER ARTICLES:
X-ray Standing Wave Studies of Minerals and Mineral Surfaces: Principles and Applications.
M. J. Bedzyk and L. Cheng (2002)
Reviews in Mineralogy and Geochemistry 49, 221-266
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