Note to users. If you're seeing this message, it means that your browser cannot find this page's style/presentation instructions -- or possibly that you are using a browser that does not support current Web standards. Find out more about why this message is appearing, and what you can do to make your experience of our site the best it can be.


Science 15 May 1992:
Vol. 256. no. 5059, pp. 1009 - 1012
DOI: 10.1126/science.256.5059.1009

Articles

High-Resolution Imaging by Fourier Transform X-ray Holography

Ian McNulty 1, Janos Kirz 1, Chris Jacobsen 1, Erik H. Anderson 2, Malcolm R. Howells 2, and Dieter P. Kern 3

1 Physics Department, State University of New York, Stony Brook, NY 11794-3800
2 Lawrence Berkeley Laboratory, Berkeley, CA 94720
3 IBM Thomas J. Watson Research Center, Yorktown Heights, NY 10598

Fourier transform x-ray holography has been used to image gold test objects with submicrometer structure, resolving features as small as 60 nanometers. The hologram-recording instrument uses coherent 3.4-nanometer radiation from the soft x-ray undulator beamline X1A at the National Synchrotron Light Source. The specimen to be imaged is placed near the first-order focal spot produced by a Fresnel zone plate; the other orders, chiefly the zeroth, illuminate the specimen. The wave scattered by the specimen interferes with the spherical reference wave from the focal spot, forming a hologram with fringes of low spatial frequency. The hologram is recorded in digital form by a charge-coupled device camera, and the specimen image is obtained by numerical reconstruction.

Submitted on December 2, 1991
Accepted on March 16, 1992


THIS ARTICLE HAS BEEN CITED BY OTHER ARTICLES:
High-Resolution Scanning X-ray Diffraction Microscopy.
P. Thibault, M. Dierolf, A. Menzel, O. Bunk, C. David, and F. Pfeiffer (2008)
Science 321, 379-382
   Abstract »    Full Text »    PDF »



To Advertise     Find Products


Science. ISSN 0036-8075 (print), 1095-9203 (online)