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Science 15 December 1989:
Vol. 246. no. 4936, pp. 1400 - 1405
DOI: 10.1126/science.246.4936.1400
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Articles

Ferroelectric Memories

James F. Scott 1 and Carlos A. Paz de Araujo 2

1 Professor of physics and chairman of the Condensed Matter Laboratory at the University of Colorado, Boulder, CO 80309
2 Professor of electrical engineering and director of the Microelectronics Laboratory at the University of Colorado, Colorado Springs, CO 80933

In the past year it has become possible to fabricate ferroelectric thin-film memories onto standard silicon integrated circuits that combine very high speed (30-nanosecond read/erase/rewrite operation), 5-volt standard silicon logic levels, very high density (2 by 2 micrometer cell size), complete nonvolatility (no standby power required), and extreme radiation hardness. These ferroelectric random-access memories are expected to replace magnetic core memory, magnetic bubble memory systems, and electrically erasable read-only memory for many applications. The switching kinetics of these films, 100 to 300 nanometers thick, are now well understood, with switching times that fit an activation field dependence that scales applied field and temperature. Earlier problems of fatigue and retention failure are also now understood and have been improved to acceptable levels.


THIS ARTICLE HAS BEEN CITED BY OTHER ARTICLES:
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Applications of Modern Ferroelectrics.
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Combinatorial approach for ferroelectric material libraries prepared by liquid source misted chemical deposition method.
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Epitaxial Cuprate Superconductor/Ferroelectric Heterostructures.
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