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Science 16 October 1987:
Vol. 238. no. 4825, pp. 342 - 344
DOI: 10.1126/science.238.4825.342
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Articles

The Microstructure of High—Critical Current Superconducting Films

P. CHAUDHARI 1, F. K. LEGOUES 1, and ARMIN SEGMÜLLER 1

1 IBM Thomas J. Watson Research Center, Yorktown Heights, NY 10598.

The microstructure of superconducting films that have shown high-critical current densities has been studied. The films are shown to be epitaxial and contain twins and precipitates. The main difference between these films and low current carrying samples is the absence of grain boundaries. These boundaries are therefore identified as the cause of the lower critical current in ceramic samples.

Submitted on July 17, 1987
Accepted on September 9, 1987


THIS ARTICLE HAS BEEN CITED BY OTHER ARTICLES:
Direct Observation of Structural Defects in Laser-Deposited Superconducting Y-Ba-Cu-O Thin Films.
R. Ramesh, D. M. Hwang, T. Venkatesan, T. S. Ravi, L. Nazar, A. Inam, X. D. Wu, B. Dutta, G. Thomas, A. F. Marshall, et al. (1990)
Science 247, 57-59
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Science. ISSN 0036-8075 (print), 1095-9203 (online)