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Articles
Delayed Light Imaging for the Early Detection of Plant Stress
1 Boyce Thompson Institute, Cornell University, Ithaca, New York 14853
Image-intensified photographs of delayed light emission (DLE) from soybean leaves exposed to sulfur dioxide showed evidence of the stress that developed during the exposure period. A comparison of DLE images taken during the fumigation with a conventional photograph taken 5 days later showed a clear correspondence between leaf areas that had the most diminished DLE intensity and those that showed the greatest visible injury. These results suggest that DLE imagery will be a useful tool in the investigation of the spatial distribution and temporal development of plant stress. Revised on October 29, 1981
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Science. ISSN 0036-8075 (print), 1095-9203 (online)