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Science 19 October 1979:
Vol. 206. no. 4416, pp. 353 - 355
DOI: 10.1126/science.206.4416.353
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Articles

Laser-EXAFS: Fast Extended X-ray Absorption Fine Structure Spectroscopy with a Single Pulse of Laser-Produced X-rays

P. J. MALLOZZI 1, R. E. SCHWERZEL 1, H. M. EPSTEIN 1, and B. E. CAMPBELL 1

1 Battelle, Columnbus Laboratories, Columbus, Ohio 43201

The extended x-ray absorption fine structure (EXAFS) spectrum of aluminum has been measured with a nanosecond pulse of soft x-rays generated by a laser-produced plasma. This technique provides a practical alternative to synchrotorn radiation for the acquisition of EXAFS data. It also provides a unique capability for the analysis of molecular structure in highly transient chemical species.

Submitted on June 25, 1979
Revised on August 27, 1979

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Science. ISSN 0036-8075 (print), 1095-9203 (online)