Note to users. If you're seeing this message, it means that your browser cannot find this page's style/presentation instructions -- or possibly that you are using a browser that does not support current Web standards. Find out more about why this message is appearing, and what you can do to make your experience of our site the best it can be.


Science 17 February 1978:
Vol. 199. no. 4330, pp. 765 - 768
DOI: 10.1126/science.199.4330.765

Articles

The Proton Microprobe: A Powerful Tool for Nondestructive Trace Element Analysis

FRITZ BOSCH 1, AHMED EL GORESY 1, BERND MARTIN 1, BOGDAN POVH 1, RAINER NOBILING 2, DIRK SCHWALM 2, and KURT TRAXEL 2

1 Max-Planck-Institut für Kernphysik, D-6900 Heidelberg, Germany
2 Physikalisches Institut der Universität Heidelberg, D-6900 Heidelberg

A proton microprobe capable of focusing proton beams with energies up to 6 million electron volts to a spot size of 2 x 2 square micrometers has been used for chemical analysis of small grains of minerals in lunar samples by proton-induced x-ray emission. The proton microprobe is preferable to the electron microprobe for analyzing trace elements whose concentrations are below the detection limit of the latter and for analyzing objects with numerous major and trace elements with a wide range of atomic numbers. Application of the proton microprobe to biological samples is feasible.

Submitted on May 23, 1977
Revised on December 12, 1977





To Advertise     Find Products


Science. ISSN 0036-8075 (print), 1095-9203 (online)