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Science 22 August 2008:
Vol. 321. no. 5892, pp. 1066 - 1069
DOI: 10.1126/science.1160777


Observation of Atomic Diffusion at Twin-Modified Grain Boundaries in Copper
Kuan-Chia Chen, Wen-Wei Wu, Chien-Neng Liao, Lih-Juann Chen, K. N. Tu

Supporting Online Material

This supplement contains:
Materials and Methods
Fig. S1

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Other Supporting Online Material for this manuscript includes the following: (available at www.sciencemag.org/cgi/content/full/321/5892/1066/DC1)
Movie S1

Movie s1
An in-situ TEM movie shows atomic-scale electromigration at twin-modified grain boundaries in copper. In this movie, the atomic step moves to the right in the direction against the electron flux. The time of the image capture is given at the lower-left corner in minutes and seconds (MPEG; 3.9 MB).

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Science. ISSN 0036-8075 (print), 1095-9203 (online)