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Supplementary MaterialThis supplement contains:
Fig. S1: Transmission electron diffraction patterns showing the film
microstructure. (A) Diffraction pattern of the as deposited material shows only the
diffuse scattering characteristic of an amorphous material. (B) The final calcite film has
a crystalline diffraction pattern. Images recorded in a JEOL 2010F TEM in scanning-
TEM mode with a 3mrad convergence angle and 5 pA of beam current to minimize
sample charging, which occurred when operated with the higher beam currents of TEM
mode. (C) TEM image of a sample calcite section and electron diffraction pattern from
the entire region. Shards of the crystal were cross-sectioned by ultramicrotoming to
produce 70-nm-thick electron transparent sections. Operating the microscope at low
magnifications (2000x), we were able to obtain diffraction patterns from crystal sections
as large as 50
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Science. ISSN 0036-8075 (print), 1095-9203 (online)