Figure 1

Fig. 1. STM topographic images of defects in the bilayer epitaxial graphene sample. (A) Large field of view showing a variety of defects. Type A defects (red arrow) are subsurface irregularities blanketed by graphene. The defect indicated by the red arrow has a height of 2 Å. Type B defects are atomic-scale defects in the graphene lattice. Higher-magnification images from the boxed regions in (A) are shown: a defect-free region (B) and complex scattering patterns around type B defects [(C) and (D)]. Tunneling setpoint: I = 100 pA, V = 300 mV. [View Larger Version of this Image (366K JPEG file)]

 

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