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Science 26 March 2004:
Vol. 303. no. 5666, pp. 2001 - 2004
DOI: 10.1126/science.1093617
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Reports

Atomic-Resolution Measurement of Oxygen Concentration in Oxide Materials

C. L. Jia and K. Urban*

Using high-resolution imaging at negative spherical aberration of the objective lens in an aberration-corrected transmission electron microscope, we measure the concentration of oxygen in {Sigma}3{111} twin boundaries in BaTiO3 thin films at atomic resolution. On average, 68% of the boundary oxygen sites are occupied, and the others are left vacant. The modified Ti2O9 group unit thus formed reduces the grain boundary energy and provides a way of accommodating oxygen vacancies occurring in oxygen-deficient material by the formation of a nanotwin lamellae structure. The atomically resolved measurement technique offers the potential for studies on oxide materials in which the electronic properties sensitively depend on the local oxygen content.

Institute for Solid State Research, Research Center Jülich, D-52425 Jülich, Germany.

* To whom correspondence should be addressed. E-mail: k.urban{at}fz-juelich.de

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THIS ARTICLE HAS BEEN CITED BY OTHER ARTICLES:
Performance and image analysis of the aberration-corrected Hitachi HD-2700C STEM.
H. Inada, L. Wu, J. Wall, D. Su, and Y. Zhu (2009)
J. Electron Microsc. (Tokyo) 58, 111-122
   Abstract »    Full Text »    PDF »
Studying Atomic Structures by Aberration-Corrected Transmission Electron Microscopy.
K. W. Urban (2008)
Science 321, 506-510
   Abstract »    Full Text »    PDF »


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Science. ISSN 0036-8075 (print), 1095-9203 (online)