Note to users. If you're seeing this message, it means that your browser cannot find this page's style/presentation instructions -- or possibly that you are using a browser that does not support current Web standards. Find out more about why this message is appearing, and what you can do to make your experience of our site the best it can be.

Site Tools

  • AAAS
  • Subscribe
  • Feedback

Site Search

Search Advanced

Science 31 October 2003:
Vol. 302. no. 5646, pp. 846 - 849
DOI: 10.1126/science.1089785
Prev | Table of Contents | Next

Reports

Direct Atom-Resolved Imaging of Oxides and Their Grain Boundaries

Zaoli Zhang, Wilfried Sigle, Fritz Phillipp, Manfred Rühle*

Using high-resolution transmission electron microscopy, we obtained structure images of strontium titanate (SrTiO3) with a clearly resolved oxygen sublattice along different crystallographic directions in the bulklattice and for a {Sigma}3 tilt grain boundary. Comparison with image simulations showed that the grain boundary contains oxygen vacancies. Measurements of atom displacements near the grain boundary revealed close correspondence with theoretical calculations.

Max-Planck-Institut für Metallforschung, Heisenbergstraße 3, D-70569 Stuttgart, Germany.

* To whom correspondence should be addressed. E-mail: ruehle{at}mf.mpg.de

Read the Full Text


THIS ARTICLE HAS BEEN CITED BY OTHER ARTICLES:
Atomic-Resolution Measurement of Oxygen Concentration in Oxide Materials.
C. L. Jia and K. Urban (2004)
Science 303, 2001-2004
   Abstract »    Full Text »    PDF »


To Advertise     Find Products

Science. ISSN 0036-8075 (print), 1095-9203 (online)