Note to users. If you're seeing this message, it means that your browser cannot find this page's style/presentation instructions -- or possibly that you are using a browser that does not support current Web standards. Find out more about why this message is appearing, and what you can do to make your experience of our site the best it can be.

Science 8 December 1995:
Vol. 270. no. 5242, pp. 1646 - 1648
DOI: 10.1126/science.270.5242.1646
Prev | Table of Contents | Next

Reports

Defect Motion on an InP(110) Surface Observed with Noncontact Atomic Force Microscopy

Yasuhiro Sugawara,  Masahiro Ohta,  Hitoshi Ueyama,  Seizo Morita

With an atomic force microscope operating in the noncontact mode in an ultrahigh vacuum, atomic-resolution imaging of the cleaved semi-insulating InP(110) surface has been achieved. By this method, atomic scale point defects and their motion were observed at room temperature, without the field-induced effects associated with scanning tunneling microscopy.


Department of Physics, Faculty of Science, Hiroshima University, 1-3-1 Kagamiyama, Higashi-Hiroshima, Hiroshima 739, Japan.

To Advertise     Find Products

Science. ISSN 0036-8075 (print), 1095-9203 (online)