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Science 12 November 1993:
Vol. 262. no. 5136, pp. 1029 - 1032
DOI: 10.1126/science.262.5136.1029
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Articles

Picosecond Resolution in Scanning Tunneling Microscopy

G. Nunes Jr. 1 and M. R. Freeman 1

1 IBM Thomas J. Watson Research Center, P.O. Box 218, Yorktown Heights, NY 10598

A method has been developed for performing fast time-resolved experiments with a scanning tunneling microscope. The method uses the intrinsic nonlinearity in the microscope's current versus voltage characteristics to resolve optically generated transient signals on picosecond time scales. The ability to combine the spatial resolution of tunneling microscopy with the time resolution of ultrafast optics yields a powerful tool for the investigation of dynamic phenomena on the atomic scale.

Submitted on August 2, 1993
Accepted on September 28, 1993

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Science. ISSN 0036-8075 (print), 1095-9203 (online)