Note to users. If you're seeing this message, it means that your browser cannot find this page's style/presentation instructions -- or possibly that you are using a browser that does not support current Web standards. Find out more about why this message is appearing, and what you can do to make your experience of our site the best it can be.


Science 7 May 1993:
Vol. 260. no. 5109, pp. 789 - 792
DOI: 10.1126/science.260.5109.789

Articles

X-ray Tomographic Study of Chemical Vapor Infiltration Processing of Ceramic Composites

J. H. Kinney 1, T. M. Breunig 2, T. L. Starr 3, D. Haupt 1, M. C. Nichols 2, S. R. Stock 3, M. D. Butts 3, and R. A. Saroyan 1

1 Lawrence Livermore National Laboratory, Livermore, CA 94551
2 Sandia National Laboratories, Livermore, CA 94550
3 Georgia Institute of Technology, Atlanta, GA 30332

The fabrication of improved ceramic-matrix composites will require a better understanding of processing variables and how they control the development of the composite microstructure. Noninvasive, high-resolution methods of x-ray tomography have been used to measure the growth of silicon carbide in a woven Nicalon-fiber composite during chemical vapor infiltration. The high spatial resolution allows one to measure the densification within individual fiber tows and to follow the closure of macroscopic pores in situ. The experiments provide a direct test of a recently proposed model that describes how the surface area available for matrix deposition changes during infiltration. The measurements indicate that this surface area is independent of the fiber architecture and location within the preform and is dominated by large-scale macroporosity during the final stages of composite consolidation. The measured surface areas are in good agreement with the theoretical model.

Submitted on December 3, 1992
Accepted on February 23, 1993


THIS ARTICLE HAS BEEN CITED BY OTHER ARTICLES:
Study of the microgeometry of porous materials using synchrotron computed microtomography.
K. W. Jones, H. Feng, W. B. Lindquist, P. M. Adler, J. F. Thovert, B. Vekemans, L. Vincze, I. Szaloki, R. Van Grieken, F. Adams, et al. (2003)
Geological Society, London, Special Publications 215, 39-49
   Abstract »    PDF »
Ultrahigh-Resolution X-ray Tomography.
W. S. Haddad, I. McNulty, J. E. Trebes, E. H. Anderson, R. A. Levesque, and L. Yang (1994)
Science 266, 1213-1215
   Abstract »    PDF »



To Advertise     Find Products


Science. ISSN 0036-8075 (print), 1095-9203 (online)