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Science 6 September 1991:
Vol. 253. no. 5024, pp. 1123 - 1125
DOI: 10.1126/science.253.5024.1123
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Articles

Synchrotron X-ray Diffraction from a Microscopic Single Crystal Under Pressure

E. F. SKELTON 1, J. D. AYERS 1, S. B. QADRI 1, N. E. MOULTON 1, K. P. COOPER 1, L. W. FINGER 2, H. K. MAO 2, and Z. HU 2

1 Condensed Matter and Radiation Sciences Division and Materials Science and Technology Division, Naval Research Laboratory, Washington, DC 20375
2 Geophysical Laboratory and Center for High Pressure Research, National Science Foundation Science and Technology Center, Carnegie Institution of Washington, Washington, DC 20015

Metallic filaments with submicrometer diametere have been fabricated. Standard diffraction techniques with conventional x-ray sources were unsuccessful in identifying the structure of these materials. However, with the use of synchrotron radiation produced on a wiggler beam line, diffraction data were obtained in measurement periods as short as 10 milliseconds. Two cylindrical single crystals of bismuth were studied, each with a diameter of 0.22 ± 0.02 micrometer. The volume of sample illuminated for these measurements was 0.38 cubic micrometer, less than 0.5 femtoliter. The crystals are grown in glass capillaries, and, because bismuth expands on solidification, they are under a residual hoop stress. The crystallographic data indicate the presence of a linear compressive strain of about 2 percent, which is assumed to be the result of a residual stress of about 2 gigapascals.

Submitted on April 24, 1991
Accepted on June 27, 1991


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