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Science 5 January 1990:
Vol. 247. no. 4938, pp. 57 - 59
DOI: 10.1126/science.247.4938.57
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Articles

Direct Observation of Structural Defects in Laser-Deposited Superconducting Y-Ba-Cu-O Thin Films

R. Ramesh 1, D. M. Hwang 1, T. Venkatesan 1, T. S. Ravi 1, L. Nazar 1, A. Inam 2, X. D. Wu 2, B. Dutta 3, G. Thomas 4, A. F. Marshall 5, and T. H. Geballe 5

1 Bellcore, Red Bank, NJ 07701
2 Rutgers University, Piscataway, NJ 08854
3 Middlebury College, Middlebury, VT 05753
4 Department of Materials Science and Mineral Engineering and National Center for Electron Microscopy, Materials and Chemical Sciences Division, Lawrence Berkeley Laboratory, University of California, Berkeley, CA 94720
5 Stanford University, Stanford, CA 94305

The defect structure of in situ pulsed, laser-deposited, thin films of the high—transition temperature superconductor Y-Ba-Cu-O has been observed directly by atomic resolution electron microscopy. In a thin film with the nominal composition YBa2Cu3O7 (123), stacking defects corresponding to the cationic stoichiometry of the 248, 247, and 224 compounds have been observed. Other defects observed include edge dislocations and antiphase boundaries. These defects, which are related to the nonequilibrium processing conditions, are likely to be responsible for the higher critical currents observed in these films as compared to single crystals.

Submitted on September 6, 1989
Accepted on October 26, 1989


THIS ARTICLE HAS BEEN CITED BY OTHER ARTICLES:
Growth Mechanism of Sputtered Films of YBa2Cu3O7 Studied by Scanning Tunneling Microscopy.
M. HAWLEY, I. D. RAISTRICK, J. G. BEERY, and R. J. HOULTON (1991)
Science 251, 1587-1589
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