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Science 5 May 1989:
Vol. 244. no. 4904, pp. 559 - 562
DOI: 10.1126/science.244.4904.559
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Articles

Long-Range Electronic Perturbations Caused by Defects Using Scanning Tunneling Microscopy

H. A. MIZES 1 and J. S. FOSTER 2

1 Xerox Webster Research Center, Webster, NY 14580.
2 IBM Research Division, Almaden Research Center, San Jose, CA 95120.

Real-space observations of long-range electronic perturbations caused by defects have been made with scanning tunneling microscopy. The defects are isolated adsorbed molecules on the surface of graphite. These defects perturb the charge density, giving periodic oscillations similar to Friedel oscillations. The oscillations have a wavelength radic3 times that of the graphite lattice, and the symmetry of the oscillations reflects the nature of the defect.

Submitted on December 19, 1988
Accepted on March 10, 1989


THIS ARTICLE HAS BEEN CITED BY OTHER ARTICLES:
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