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Science 18 September 1987: Vol. 237. no. 4821, pp. 1439 - 1444 DOI: 10.1126/science.237.4821.1439
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Articles
Three-Dimensional X-ray Microtomography
BRIAN P. FLANNERY 1,
HARRY W. DECKMAN 1,
WAYNE G. ROBERGE 2, and
KEVIN L. D'AMICO 1
1 Exxon Research and Engineering Company, Corporate Research Laboratories, Annandale, NJ 08801.
2 Assistant professor of physics, Rensselaer Polytechnic Institute, Troy, NY 12180.
The new technique of x-ray microtomography nondestructively generates three-dimensional maps of the x-ray attenuation coefficient inside small samples with approximately 1 percent accuracy and with resolution approaching 1 micrometer. Spatially resolved elemental maps can be produced with synchrotron x-ray sources by scanning samples at energies just above and below characteristic atomic absorption edges. The system consists of a high-resolution imaging x-ray detector and high-speed algorithms for tomographic image reconstruction. The design and operation of the microtomography device are described, and tomographic images that illustrate its performance with both synchrotron and laboratory x-ray sources are presented.
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