Note to users. If you're seeing this message, it means that your browser cannot find this page's style/presentation instructions -- or possibly that you are using a browser that does not support current Web standards. Find out more about why this message is appearing, and what you can do to make your experience of our site the best it can be.

Science 12 October 1979:
Vol. 206. no. 4415, pp. 162 - 168
DOI: 10.1126/science.206.4415.162
Prev | Table of Contents | Next

Articles

Inner-Shell Electron Spectroscopy for Microanalysis

David C. Joy 1 and Dennis M. Maher 1

1 Members of the Technical Staff, Bell Laboratories, Murray Hill, New Jersey 07974

The transmission electron energy-loss spectrum shows characteristic "edges" corresponding to the excitation of inner-shell electrons of atoms in a thin sample. Analysis of these edges provides detailed chemical, structural, and electronic data from the radiated volume. By combining electron spectroscopy and electron microscopy, this microanalytical technique can be performed in conjunction with highresolution imaging of the sample. It is shown that this approach has advantages of sensitivity, spatial resolution, and convenience over other comparable techniques.


THIS ARTICLE HAS BEEN CITED BY OTHER ARTICLES:
High-resolution scanning transmission electron microscopy.
A. Crewe (1983)
Science 221, 325-330
   PDF »
Improved detail in biological soft X-ray microscopy: study of blood platelets.
R Feder, J. Costa, P Chaudhari, and D Sayre (1981)
Science 212, 1398-1400
   Abstract »    PDF »


To Advertise     Find Products

Science. ISSN 0036-8075 (print), 1095-9203 (online)