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Science 24 March 1978:
Vol. 199. no. 4335, pp. 1295 - 1302
DOI: 10.1126/science.199.4335.1295

Articles

Seeing with a New Light: Synchrotron Radiation

R. E. Watson 1 and M. L. Perlman 2

1 Physicist, at Brookhaven National Laboratory, Upton, Long Island, New York 11973
2 Senior chemist at Brookhaven National Laboratory, Upton, Long Island, New York 11973

The special properties of synchrotron light are leading to a rapid increase in its utilization for both research and technology. At wavelength in the ultraviolet region of the broad spectrum in these beams a number of atomic, molecular, and solid-state spectroscopies are being pursued; soft x-rays are being used for spectroscopy, lithography, microscopy, and topography; at still shorter wavelengths, advantage is taken of scattering properties to probe the structure of matter. Characteristics of synchrotron radiation and of the sources which produce it are described, and some typical investigations and applications are presented to suggest the versatility of these sources.


THIS ARTICLE HAS BEEN CITED BY OTHER ARTICLES:
Inner-Shell Electron Spectroscopy for Microanalysis.
D. C. Joy and D. M. Maher (1979)
Science 206, 162-168
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The Free-Electron Laser.
J. M. J. MADEY (1978)
Science 202, 821-823
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LIII-Edge Anomalous X-ray Scattering by Cesium Measured with Synchrotron Radiation.
J. C. PHILLIPS, D. H. TEMPLETON, L. K. TEMPLETON, and K. O. HODGSON (1978)
Science 201, 257-259
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Science. ISSN 0036-8075 (print), 1095-9203 (online)