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Science 10 March 1978:
Vol. 199. no. 4333, pp. 1037 - 1040
DOI: 10.1126/science.199.4333.1037
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Articles

Normal Metallic Point Contacts

A. G. M. Jansen 1, F. M. Mueller 2, and P. Wyder 2

1 Graduate student, University of Nijmegen, Nijmegen, Netherlands
2 Professor of physics at the Physics Laboratory, University of Nijmegen, Nijmegen, Netherlands

The measured voltage derivative of the nonlinear resistance of tiny point contacts can be separated into a phonon-emission effect (agr2F) and an analytic functional form (background effect). The agr2F's show structure coincident with bulk phonon densities of states. Values of the integral of 2 agr2F/ohgr are closely related to literature values. The background effect is related to the impurity concentration of the materials.

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Science. ISSN 0036-8075 (print), 1095-9203 (online)