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Science 10 November 1972:
Vol. 178. no. 4061, pp. 608 - 611
DOI: 10.1126/science.178.4061.608
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Articles

A Scanning X-Ray Microscope Using Synchrotron Radiation

Paul Horowitz 1 and John A. Howell 1

1 Physics Department, Harvard University, Cambridge, Massachusetts

Focused synchrotron radiation collimated by means of a pinhole has been used to construct a scanning x-ray microscope capable of making stereoscopic element-discriminating pictures of relatively thick specimens in an atmospheric environment.


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