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Science 1 March 1968:
Vol. 159. no. 3818, pp. 973 - 975
DOI: 10.1126/science.159.3818.973-a
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Articles

X-ray Diffraction: New High-Speed Technique Based on X-ray Spectrography

Bill C. Giessen 1 and Glen E. Gordon 2

1 Department of Metallurgy and Material Science, Massachusetts Institute of Technology, Cambridge 02139
2 Department of Chemistry and Laboratory for Nuclear Science, Massachusetts Institute of Technology

A method has been developed for obtaining lattice spacings of powder samples by x-ray diffraction in times potentially as short as 1 second. The sample is irradiated with polychromatic radiation from an x-ray tube, and the energy spectrum of x-rays scattered at a given angle is observed with a semiconductor radiation detector, coupled with a pulse-height analyzer.


THIS ARTICLE HAS BEEN CITED BY OTHER ARTICLES:
Lunar Surface Material: Spacecraft Measurements of Density and Strength.
L. D. Jaffe and L. D. Jaffe (1969)
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Lunar Rivers.
R. E. Lingenfelter, R. E. Lingenfelter, S. J. Peale, and G. Schubert (1968)
Science 161, 266-269
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Science. ISSN 0036-8075 (print), 1095-9203 (online)